KHOO, Voon Ching. A Case Study of Return On Investment for Multi-sites Test Handler in The Semiconductor Industry Through Theory of Industry 4.0 ROI Relativity. International Journal of Recent Contributions from Engineering, Science & IT (iJES), [S. l.], v. 7, n. 3, p. pp. 23–40, 2019. DOI: 10.3991/ijes.v7i3.11057. Disponível em: https://online-journals.org/index.php/i-jes/article/view/11057. Acesso em: 19 apr. 2024.