Khoo, Voon Ching. “A Case Study of Return On Investment for Multi-Sites Test Handler in The Semiconductor Industry Through Theory of Industry 4.0 ROI Relativity”. International Journal of Recent Contributions from Engineering, Science & IT (iJES) 7, no. 3 (September 25, 2019): pp. 23–40. Accessed November 23, 2024. https://online-journals.org/index.php/i-jes/article/view/11057.