Online MOS Capacitor Characterization in LabVIEW Environment

Authors

  • Chinmay K Maiti IIT Kharagpur India
  • S C Pandey IIT Kharagpur
  • A Maiti Vidyasagar University
  • T K Maiti IIT Kharagpur

DOI:

https://doi.org/10.3991/ijoe.v5i5.1000

Keywords:

LabVIEW, MOS capacitor characterization, virtual instrumentation

Abstract


We present an automated evaluation procedure to characterize MOS capacitors involving high-k gate dielectrics. Suitability of LabVIEW environment for online web-based semiconductor device characterization is demonstrated. Developed algorithms have been successfully applied to automate the MOS capacitor measurements for Capacitance-Voltage, Conductance-Voltage and Current-Voltage characteristics. Implementation of the algorithm for use as a remote internet-based characterization tool where the client and server communicate with each other via web services is also shown.

Author Biographies

Chinmay K Maiti, IIT Kharagpur India

Professor and Head

S C Pandey, IIT Kharagpur

Department of Electronics & ECE, Indian Institute of Technology, Kharagpur 721302 India

A Maiti, Vidyasagar University

B-181, IIT Kharagpur 721302

T K Maiti, IIT Kharagpur

Department of Electronics & ECE, Indian Institute of Technology, Kharagpur 721302 India

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Published

2009-07-30

How to Cite

Maiti, C. K., Pandey, S. C., Maiti, A., & Maiti, T. K. (2009). Online MOS Capacitor Characterization in LabVIEW Environment. International Journal of Online and Biomedical Engineering (iJOE), 5(5), pp. 57–60. https://doi.org/10.3991/ijoe.v5i5.1000

Issue

Vol. 5 (2009): Special Issue REV2009

Section

Special Focus Papers