Integrated Circuits Testing: Remote Access to Test Equipment for Labs and Engineering
Keywords:Automated Test Equipment, IC Testing, Remote Labs, Education
This paper concerns the local and remote use of an Integrated Circuits (IC) Automated Test Equipment (ATE) for both educational and engineering purposes. This experience was initiated in 1998 in the context of a French network (CNFM) in order to provide a distant control to industrial equipment for academic and industrial people. The actual shared resource is a Verigy V93K System on Chip (SoC) tester platform. The cost of such an equipment is close to 1Mâ?¬, without taking into account the maintenance and attached human resources expenses to make it work properly daily. Although the sharing of this equipment seems to be obvious for education, the French experience is quite a unique example in the world. Here, practical information regarding IC testing and network setup for remote access are detailed, together with the associated training program.
How to Cite
The submitting author warrants that the submission is original and that she/he is the author of the submission together with the named co-authors; to the extend the submission incorporates text passages, figures, data or other material from the work of others, the submitting author has obtained any necessary permission.
Articles in this journal are published under the Creative Commons Attribution Licence (CC-BY What does this mean?). This is to get more legal certainty about what readers can do with published articles, and thus a wider dissemination and archiving, which in turn makes publishing with this journal more valuable for you, the authors.
By submitting an article the author grants to this journal the non-exclusive right to publish it. The author retains the copyright and the publishing rights for his article without any restrictions.