LATORRE, Laurent; PRADARELLI, Beatrice; NOUET, Pascal. Integrated Circuits Testing: Remote Access to Test Equipment for Labs and Engineering. International Journal of Online and Biomedical Engineering (iJOE), [S. l.], v. 5, n. 5, p. pp. 43–50, 2009. DOI: 10.3991/ijoe.v5i5.1013. Disponível em: https://online-journals.org/index.php/i-joe/article/view/1013. Acesso em: 23 nov. 2024.